Mechanical and electronic properties of CdTe tetrapods studied by atomic force microscopy
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Mechanical and electrical properties of CdTe tetrapods studied by atomic force microscopy.
The mechanical and electrical properties of CdTe tetrapod-shaped nanocrystals have been studied with atomic force microscopy. Tapping mode images of tetrapods deposited on silicon wafers revealed that they contact the surface with three of its arms. The length of these arms was found to be 130+/-10 nm. A large fraction of the tetrapods had a shortened vertical arm as a result of fracture during...
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